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Search for "three-dimensional atomic force microscopy" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73
- spectroscopy; NC-AFM; three-dimensional atomic force microscopy; tip asymmetry; tip elasticity; Introduction Experimentally obtained information about atomic-scale interactions of specific surfaces with atoms, molecules, and other surfaces in their vicinity is crucial for a number of important scientific
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